Expanding the Depth of Field for Imaging with Low keV Electrons: High Resolution Surface Observations of Nanostructured LaB6 Using Low keV Secondary and Backscattered Electrons

Takeshi Sunaoshi; Satoshi Okada; Kazutoshi Kaji; Edgar Voelkl; Roshini Ramachandran; Tina Salguero

doi:10.1017/S1431927617009813

Expanding the Depth of Field for Imaging with Low keV Electrons: High Resolution Surface Observations of Nanostructured LaB6 Using Low keV Secondary and Backscattered Electrons

Takeshi Sunaoshi, Satoshi Okada, Kazutoshi Kaji, Edgar Voelkl, Roshini Ramachandran, Tina Salguero

Research output: Contribution to journal › Article › peer-review

Original language	American English
Journal	Microscopy and Microanalysis
Volume	23
Issue number	S1
DOIs	https://doi.org/10.1017/S1431927617009813
State	Published - Aug 4 2017
Externally published	Yes

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10.1017/S1431927617009813

Cite this

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title = "Expanding the Depth of Field for Imaging with Low keV Electrons: High Resolution Surface Observations of Nanostructured LaB6 Using Low keV Secondary and Backscattered Electrons",

author = "Takeshi Sunaoshi and Satoshi Okada and Kazutoshi Kaji and Edgar Voelkl and Roshini Ramachandran and Tina Salguero",

year = "2017",

month = aug,

day = "4",

doi = "10.1017/S1431927617009813",

language = "American English",

volume = "23",

journal = "Microscopy and Microanalysis",

issn = "1435-8115",

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T1 - Expanding the Depth of Field for Imaging with Low keV Electrons: High Resolution Surface Observations of Nanostructured LaB6 Using Low keV Secondary and Backscattered Electrons

AU - Sunaoshi, Takeshi

AU - Okada, Satoshi

AU - Kaji, Kazutoshi

AU - Voelkl, Edgar

AU - Ramachandran, Roshini

AU - Salguero, Tina

PY - 2017/8/4

Y1 - 2017/8/4

U2 - 10.1017/S1431927617009813

DO - 10.1017/S1431927617009813

M3 - Article

SN - 1435-8115

VL - 23

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - S1

ER -